基于ARM7的硅钢片铁损测试仪*

作者：杭亮，顾伟驷，苏英俩 日期：2009-04-21/span> 浏览：2995 查看PDF文档

基于ARM7的硅钢片铁损测试仪*

杭亮，顾伟驷，苏英俩
（浙江工业大学 信息学院，浙江 杭州 310014）

摘要：铁损是评价硅钢片质量好坏的一个重要指标，介绍了一种运用ARM7智能芯片对单片硅钢片铁损进行自动测量的系统，从理论与实际运用两方面探讨了如何在不同磁通密度下对不同厚度和密度的单片硅钢片的铁损测量，并对系统的主要部分进行了介绍，包括励磁机构、电源以及软件设计。实验结果表明，该铁损测试仪器具有成本低、可靠性高、扩充和维护方便等优点，具有一定的推广应用价值。
关键词：硅钢片；单片；铁损；磁通密度；测量
中图分类号：TM936.5文献标识码：A文章编号：1001-4551(2009)03-0047-03

Silicon steel single sheet tester based on ARM7
HANG Liang, GU Wei-si, SU Ying-liang
(College of Information Engineering, Zhejiang University of Technology, Hangzhou 310014, China)
Abstract: Iron loss is one of the primary quality factors of silicon steel sheet. An automatic measuring system was introduced based on ARM7 for iron loss of silicon steel single sheet. It was described that how to measure the iron loss of silicon steel single sheets whose thickness and density is not same, when the magnetic flux density is different from theory and practice application. The hardware and software designs were introduced. The results demonstrate that the single sheet tester is low cost and high reliability, and it facilitates to be expanded and maintained. It is worth to be widely promoted and applied.
Key words: silicon steel; single sheet; iron loss; magnetic flux density; measure
参考文献(References):
［1］傅维谭.电磁测量［M］.北京：中央广播电视大学出版社,1985:189-224.
［2］唐统一，赵伟.电磁测量［M］.北京：清华大学出版社,1996:181-209.
［3］叶芬斌,浅井博文,陈志明,等.铁损测试仪的校准方法之研究（一）［J］.电子质量,2003(10):20-21.
［4］KHANLOU A, MOESES A J, MEYDAN T, et al. A non-enwrapping, single yoke on-line magnetic testing system for use in the steel industry［J］. IEEE Trans. on Magnetics,1992,28(5):2479-2481.
［5］MATSUBARA K, TAKAHASHI N, NAKATA T, et al. Acceleration technique of wavefor control for single sheet tester[J]. IEEE Trans.on Magnetics,1995,31(6):3400-3402.
［6］NAKATA T, TAKAHASHI N, FUJIWARA K, et al. Measurement of magnetic characteristic along arbitrary directions of grain-orineted silicon steel up to high flux densities[J]. IEEE Trans. Magnetics.,1993,29(6):3544-3546.
［7］康华光，陈大钦.电子技术基础［M］.北京：高等教育出版社，2002:75-98.
［8］周立功.ARM微控制器基础与实践［M］.北京：北京航空航天大学出版社，2003:23-80.